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Advanced computing in electron microscopy / by Kirkland, Earl J. Publication: New York : Springer, 2010 . x, 289 p. : Date:2010 Availability: Copies available: AUM Main Library (2),
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Scanning transmission electron microscopy : , imaging and analysis /   Publication: New York : Springer, 2011 . xii, 762 p. : Date:2011 Availability: Copies available: AUM Main Library (2),
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